Design Con 2015

Multidimensional Effective 3D-IC Cost Management

View comments: newest first | oldest first | threaded
David Park
User Rank
Re: data overload
David Park   8/26/2014 4:43:00 PM

Hi Flying Scot, thanks for your comments. Actually it doesn't require any more data than is generated today, but the analysis of the data is significantly more involved. Applying only good die/bad die information to 3D-IC is not enough to ensure quality end products. We need to use manufacturing data more proactively to establish a range of "goodness" that will enable better pairing of devices in multi-chip packages. This is the "big data" challenge. The data already exists to do this, but the ability to mine that data to determine what die will work best with what other die is now the challenge.

User Rank
Supply Network Guru
data overload
FLYINGSCOT   8/3/2014 10:52:51 PM

There is a huge implication in the amount of data to be supplied with each IC to ensure it is cimpatible with the other chips it is paired with.  Normally we only look for marked good/bad die but no the good die will have to come with a ton of data also.

User Rank
Supply Network Guru
Re: good article
nimantha.d   7/31/2014 6:33:54 AM

Thank you for sharing it david. Was very useful. 

User Rank
Supply Network Guru
good article
Himanshugupta   7/31/2014 4:17:24 AM

Thanks David for putting down the summary of problems and way forward for 3D-IC stacks. 3rd dimension is the way forward to keep Moor's law alive but going that route has a lot of challenges. I have not seen people putting down the challenges in such a consolidated manner as you have done in this article.

More Blogs from David Park
Semiconductor manufacturing creates huge amounts of data. Leveraged intelligently, all of this information can lead to much better business.
Semiconductor manufacturing must find new methods to improve product quality and reliability for consumer-level products. Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
EBN Dialogue / LIVE CHAT
EBN Dialogue enables you to participate in live chats with notable leaders and luminaries. Open to the entire EBN community of electronics supply chain experts, these conversations see ideas shared, comments made, and questions asked and answered in real time. Listed below are upcoming and archived chats. Stay tuned and join in!
Upcoming Dialogues
Live Chat 11/06: Enterprise Risks, Intellectual Property & Supply Chains
Enterprise risk management (ERM) frameworks can be useful to identify, assess, and manage intellectual property (IP) risks that arise in supply chain compliance. We'll look at real-world examples and strategies for mitigating those risks.
Remind Me
Archived Dialogues
Live Chat 10/30: Top 10 Metrics That Enhance Procurement Performance
We'll be talking about the 10 most important procurement performance metrics, from the old standards to new and emerging best-practices.
Live Chat 10/16: Applying a Macroeconomic Lens to the Supply Chain
EBN blogger Apek Mulay will be our guest as we talk about how macroeconomic reforms have the potential to impact the supply chain.
Latest Poll
EBN Newswire
FORT WORTH, TX   10/24/2014
Allied Electronics Releases 2015 Catalogue
Arrow Receives Its First Responsible Recycling ...
Twitter Feed
EBN Online Twitter Feed