Author: Ann R. Thryft

Ann Thryft has written for EDN, RTC Magazine, COTS Journal, NIkkei Electronics Asia, EE Times, Computer Design, and Electronic Buyers' News. She introduced readers to several emerging trends: early mobile phone architectures, set-top box system design, open network server and switch/router architectures, software-defined radio, and RFID. At EBN Ann won two independently judged Editorial Excellence awards for Best Technology Feature. Currently, she is a Contributing Technical Editor for Test & Measurement World, and assists in researching and writing reports for In-Stat. She holds a BA in Cultural Anthropology from Stanford University and a Certified Business Communicator certificate from the Business Marketing Association (formerly B/PAA).

All posts by Ann R. Thryft below: