The road to smart factory nirvana is paved with challenges. One such challenge is the need for data that truly adds value. As manufacturers look to do more with the information they collect, inspection data is rapidly growing in importance, and many consider ‘good’ inspection data to be the currency of the smart factory.
The combination of deep domain expertise, to derive ‘good’ reliable data, along with the ability to fuse that data, share it and derive intelligence from it, are essential elements to deploying an Industry 4.0 or Smart Manufacturing strategy. But how can the data quality be assured? How can it be reliably fused or shared? And how can it be processed to improve performance in terms of quality and efficiency?
Dr. Bill Cardoso, CEO of Creative Electron; Miles Moreau, global manager Products & Technologies of KIC; and Joel Scutchfield, Americas sales manager for Koh Young Technology joined me at APEX 2019 in San Diego, to discuss the use of inspection data as a currency to derive value. Having domain expertise in x-ray, thermal, and optical inspection, the three experts seemed to ideal panel to get to answer these important questions. They discuss the fusion and contextualization of data and how it can improve performance at a closed loop and open architecture level.
In this roundtable, the panelists discuss data integrity, connectivity using standards like CFX, the use of AI to process data, and much more.
Filmed on location in San Diego at the SCOOP studio with the sponsorship of Aegis Software, Cogiscan, Creative Electron, Fuji America, KIC and Koh Young Technology.